Model 12C Active Probe (DC to 500 MHz)

Rugged, dependable and high speed the Model 12C presents a very modest load to the integrated circuit. It can be used to troubleshoot high speed bipolar, NMOS and CMOS circuits-even some short holding time dynamic nodes. Each amplifier is individually optimized for peak performance and reliability. The Model 12C will withstand large input over voltages. The only known failure mode is the accidental breaking or crushing of the probe tip which can be easily replaced. A large selection of replaceable probe tips are available to accommodate a variety of probing needs.